J/D Instruments
PWS Analog Test System
Highly versatile analog I-V tester with built-in switch matrices combined with a suite of data log, graphing analysis and programming tools.
Learn more at the J/D Instruments web site.
- Semiconductor device characteristics
- Paramtrics (Voh, Vol, Vih, Vil, ...)
- FETs, Bipolar transistors, Test structures, Op Amps, Analog circuits
- Using DC, Pulse of Servo measurements
Meaure, Analyze
- Step stress testing (e.g. radiation, temp)
- Stress measurement (e.g. hot carrier injection)
- Long term reliability testing
- FLASH memory cell evaluation
- facilitation of paramter extraction
- Accurate on-wafer measurements
Provides for